Abstract: We used the co-precipitation method to create pure phase Zinc Oxide nanostructures in this study. X-ray diffraction was used to investigate the phase and scale of synthesised nanostructures (XRD). The ZnO sample calcined at 400 °C has a crystalline size of 36.1 nm, an inter planner spacing of 2.7010 Å, and a volume of 71.62 Å3. The morphological research was done using a scanning electron microscope (SEM). The IR peaks near around 510 cm-1 correspond to stretching of the Zn-O bonds, according to IR studies conducted with an FTIR spectrometer. A kaithely source metre was used to measure the current-voltage characteristics and resistivity of zinc oxide nanostructures. Impedance spectroscopy of synthesised samples was performed at room temperature using a galvinostat with an applied voltage of 120 mV and a frequency range of 50 Hz to 5 MHz. For ZnO calcined at 400°C, the grain boundary resistance is about 32 MΩ (at 310 K).

Keywords: Zinc Oxide, X-RD, SEM, FTIR, AC Impedance Spectroscopy.


Downloads: PDF | DOI: 10.17148/IARJSET.2021.8803

How to Cite:

[1] Anil Kaushik, Dr S. K. Chaudhary, Dr Ajay Kumar Mann, "Role of annealing temperature on Structural and Electric Transport properties of Pure ZnO nanoshapes," International Advanced Research Journal in Science, Engineering and Technology (IARJSET), DOI: IARJSET.2021.8803

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